[SO-PS-02] 02: Advanced and Emerging Memories / New Applications

2:24 PM - 2:26 PM JST(5:24 AM - 5:26 AM UTC)

[SO-PS-02-28] Fringe-Field-Controlled Optimized Spatial Distribution of Trap Charge to Overcome Z-Pitch Scaling Limits in 3D NAND Flash

〇Seungmin Lee¹, Yong Kyu Lee², Yong Sang Kim³ (1. Sungkyunkwan Univ. Samsung electronics (Korea), 2. Samsung Electronics (Korea), 3. Sungkyunkwan Univ. (Korea))

DOI:

https://doi.org/10.7567/SSDM.2025.PS-02-28

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