Presentation Information

[SO-PS-02-28]Fringe-Field-Controlled Optimized Spatial Distribution of Trap Charge to Overcome Z-Pitch Scaling Limits in 3D NAND Flash

〇Seungmin Lee1, Yong Kyu Lee2, Yong Sang Kim3 (1. Sungkyunkwan Univ. Samsung electronics (Korea), 2. Samsung Electronics (Korea), 3. Sungkyunkwan Univ. (Korea))

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