[SO-PS-04] 04: Power / High‐speed Devices and Materials

1:42 PM - 1:44 PM JST(4:42 AM - 4:44 AM UTC)

[SO-PS-04-07] Orientation Dependence of Structural Stability and Band Alignment for N-incorporated 4H-SiC/SiO₂ Interfaces: A DFT-Based Approach

〇Naoto Ise¹, Toru Akiyama¹, Tetsuo Hatakeyama², Kenji Shiraishi³, Takashi Nakayama⁴ (1. Mie University (Japan), 2. Toyama Prefectural University (Japan), 3. Tohoku University (Japan), 4. Chiba University (Japan))

DOI:

https://doi.org/10.7567/SSDM.2025.PS-04-07

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