[SO-PS-04] 04: Power / High‐speed Devices and Materials

1:48 PM - 1:50 PM JST(4:48 AM - 4:50 AM UTC)

[SO-PS-04-10] Investigation of the Temperature-Dependent Degradation Behaviors in RF Performance of AlGaN/GaN HEMTs Subjected to On-state DC Stress

〇Chun-Yi Hsia¹, Yi-Fan Tsao¹, Ping-Hsun Chiu¹, Chia-Hui Liu¹, Chen-Hsuan Hung¹, Heng-Tung Hsu¹ (1. National Yang Ming Chiao Tung University (Taiwan))