[SO-PS-04] 04: Power / High‐speed Devices and Materials

2:02 PM - 2:04 PM JST(5:02 AM - 5:04 AM UTC)

[SO-PS-04-17] Bias and Temperature Dependence of Threshold Voltage Instability Induced by Low Drain Bias in E-mode AlGaN/GaN HEMTs

〇Myeongsu Chae¹, Hyungtak Kim¹ (1. Hongik Univ. (Korea))