Presentation Information

[SO-PS-10-01]Impact of Microwave Annealing and Ar/O2 Plasma Treatment on the Electrical Performance and Stability of Solution-Processed IWO Thin-Film Transistors

〇Seong-Hwan Lim1, Seung-Jin Lee1, Jin-Wook Shin2, Jong-Heon Yang2, Won-Ju Cho1 (1. The Univ. of Kwangwoon (Korea), 2. The Lab. of ETRI (Korea))