Session Details
[C-2]Device Circuit Co-Design
Tue. Sep 16, 2025 3:30 PM - 4:45 PM JST
Tue. Sep 16, 2025 6:30 AM - 7:45 AM UTC
Tue. Sep 16, 2025 6:30 AM - 7:45 AM UTC
Room C (303, 3rd Floor)
Session Chair: Yasuhiro Ogasahara (AIST), Mahfuzul Islam (Science Tokyo)
[C-2-01]Normally-Off CPU with Crystal Indium Oxide Enabling Power Gating Operation with Power Supply Voltage of 0.8 V
〇Masashi Fujita1, Kouhei Toyotaka1, Kazuaki Ohshima1, Kazuma Furutani1, Takehisa Sato1, Haruki Katagiri1, Yoshinori Ando1, Motomu Kurata1, Tsutomu Murakawa1, Takanori Matsuzaki1, Tatsuya Onuki1, Yuto Yakubo1, Shunpei Yamazaki1 (1. Semiconductor Energy Laboratory Co., Ltd. (Japan))
[C-2-02]Measurement Circuit and Block Level Analysis of Continuous-Diffusion Structure induced Leakage Current in 5nm FinFET Process
〇Yuuki Uchida1, Mitsuhiko Igarashi1, Keiichiro Iwamoto1, Yoshio Takazawa1, Yasumasa Tsukamoto1 (1. Renesas Electronics Corp. (Japan))
[C-2-03]Experimental Demonstration of 1FeFET-1RRAM Field Programmable Analog Modules
〇Zhengyang Lu1, Xueyang Li1, Zhetao Ding1, Jiabao Ye1, Chengji Jing2, Xiao Yu2, Peng Lin1, Bing Chen2, Yong Ding1, Genquan Han2, Ran Cheng1 (1. Zhejiang Univ. (China), 2. Xidian Univ. (China))
[C-2-04]How Defect Dynamics in a pFET Can Be Interpreted as a Single-Node Reservoir Computer With Virtual Nodes
〇Yuanyang Guo1,2, Robin Degraeve1, Pablo Saraza-Canflanca1, Erik Bury1, Ingrid Verbauwhede2 (1. imec (Belgium), 2. KU Leuven Univ. (Belgium))