講演情報
[19p-C501-13]Analyzing magnetic structures of Mn4−xGexN films using x-ray magnetic dichroism measurement
〇Tomohiro Yasuda1, Kenta Amemiya2, Kaoru Toko1, Takashi Suemasu1 (1.Univ. of Tsukuba, 2.KEK IMSS)
キーワード：
Mn4N、MCD、Anomalous Hall effect
In previous work, we succeeded in the epitaxial growth of Mn4−xGexN on SrTiO3(001) and MgO(001) substrates, and confirmed the sign reversal of the anomalous Hall resistivity at room temperature between x = 0.4 and x = 0.6.
In this work, we made Mn4−xGexN epitaxial films (x = 0.0, 0.3 and 0.8) on SrTiO3(001) substrates and performed x-ray absorption spectroscopy (XAS) and x-ray magnetic circular dichroism (XMCD) measurements to investigate the magnetic structures at room temperature.
In this work, we made Mn4−xGexN epitaxial films (x = 0.0, 0.3 and 0.8) on SrTiO3(001) substrates and performed x-ray absorption spectroscopy (XAS) and x-ray magnetic circular dichroism (XMCD) measurements to investigate the magnetic structures at room temperature.