講演情報
[22a-A307-1][Young Scientist Presentation Award Speech] Effect of ionic liquid components on solvation structures at ionic liquid / charged solid interfaces detected by atomic force microscopy
〇Yifan Bao1, Takashi Ichii1, Toru Utsunomiya1, Hiroyuki Sugimura1 (1.Kyoto Univ.)
キーワード：
Ionic liquid、Atomic force microscopy (AFM)、Liquid/solid interface
Understanding the interfacial solvation structures of ionic liquids (IL) on charged solid surfaces is crucial. We previously visualized the solvation structures of 1-methyl-1-propylpyrrolidinium bis (trifluromethanesulfonyl) imide (Py13-TFSI) and 1-ethyl-3-methylimidazolium (EMI-) TFSI on highly charged RbI(111) surfaces and discussed the response of an IL to high surface charge at the liquid / solid interface. However, there are still several open questions regarding the IL / charged solid interface, including how an IL respond to a nearly neutral but slightly charged surface. We extend our study on surface charge-dependent solvation structures at IL / solid interfaces by probing solvation structures of ILs on a nearly neutral but slightly charged RbI{100} surface using frequency-modulation atomic force microscopy (FM-AFM). Surface-charge dependent solvation structures of two ILs which have different cationic components, EMI-TFSI containing the EMI+ cation with a delocalized charge distribution, and Py13-TFSI with a localized charge distribution in its cation, are discussed systematically.