[PS] Poster Session

[PS-17] Profile-Based Modeling of AC Stress-Induced Degradation in SiON pMOSFETs

*Kyungmin Yoon¹, Donghee Son², Yeohyeok Yun¹ (1. Koreatech (Korea), 2. Samsung Electronics (Korea))

Keywords:

SiON pMOSFET,AC Stress-Induced Degradation,Negative Bias Temperature Instability (NBTI),OFF-state stress,profile of thershold voltage shift