Presentation Information
[PS-18]New Insights into MOS Interface Degradation of pMOSFETs and nMOSFETs at Cryogenic Temperature
*Yuta Horiko1, Yutaro Masukawa1, Yuichiro Mitani1 (1. Tokyo City University (Japan))
Keywords:
MOSFET,cryogenic temperature,reliability,Fowler–Nordheim,interface trap
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