講演情報
[10p-S201-2]Stability dependence of the buried interface in tin-lead (SnPb) based perovskite solar cells (PSCs)
〇(PC)Shahrir Razey Sahamir1, Qing Shen1, Hiroshi Segawa2, Shuzi Hayase1 (1.Univ. of Electro-Com, 2.Univ. of Tokyo)
キーワード：
tin-lead SnPb perovskite、carrier selective layer、stability
Tin-lead (SnPb) perovskite solar cells (PSCs) performance have progressed beyond 24% performance conversion efficiency recently. Although the progress has made so far, the reliant on the traditional hole transport layer (HTL) i.e., PEDOT:PSS especially in the inverted structure of the SnPb perovskite solar cells limits their stability under thermal and/or light stresses. In recent reports, the stability of the self-assembled monolayer (SAM) based HTL SnPb PSCs demonstrated the best stability compared to the other variations, the deterioration mechanisms at the interfaces still remain a puzzle. In this study, we will report the stability dependence of the SnPb PSCs with respect to their buried interface. We selected PEDOT:PSS, metal oxide and SAM as the HTLs of the investigated SnPb PSCs. These materials in the buried interface of the SnPb perovskite films affected the stability of the PSCs due to the reaction initiated by the thermal and/or light stimuli. We will elucidate this effect by using XPS, XRD and FESEM studies which were conducted on the SnPb perovskite films deposited on various interfaces. We will also recommend passivation material which will work in order to hinder the progress of the de-stabilisation of the metal oxide based HTL based SnPb PSCs. It is hopeful this report will serve as guideline in order to improve the performance and the stability of the SnPb based PSCs.