Presentation Information
[P-R5-08]DEVELOPMENT OF A NEW NON-DESTRUCTIVE ELEMENTAL ANALYSIS METHOD FOR TRACE COMPONENTS USING MUON-INDUCED GAMMA RAYS
*Makoto Inagaki1, Kazuhiko Ninomiya2, Go Yoshida3, Kosei Yakushi2, Eisuke Watanabe3, Hiroki Nakada1, Izumi Umegaki4, Michael Kenya Kubo5 (1. Institute for Integrated Radiation and Nuclear Science, Kyoto University (Japan), 2. Graduate School of Advanced Science and Engineering, Hiroshima University (Japan), 3. Radiation Science Center, High Energy Accelerator Research Organization (KEK) (Japan), 4. Institute of Materials Structure Science, High Energy Accelerator Research Organization (KEK) (Japan), 5. College of Liberal Arts, International Christian University (Japan))
Keywords:
non-destructive elemental analysis,muonic atom,muonic X-ray,muon-induced gamma ray