[GS02-2] Cooling of electronic devices 2

11:50 AM - 12:05 PM JST(2:50 AM - 3:05 AM UTC)

[GS02-2-04] 過渡熱測定を用いたTIMの評価方法

〇Yasushi Kajita¹, Eiji Nakamoto², Kazuyoshi Takano³ (1. Nagoya Municipal Industrial Research Institute, 2. Ansoft Spirit Co., LTD, 3. COSMO Co., LTD.)

Keywords:

過渡熱測定,構造関数,TIM,パワー半導体デバイス,熱抵抗

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