Session Details
[7a-N405-1~6]16.1 Fundamental properties, evaluation, process and devices in disordered materials
Sun. Sep 7, 2025 9:30 AM - 11:15 AM JST
Sun. Sep 7, 2025 12:30 AM - 2:15 AM UTC
Sun. Sep 7, 2025 12:30 AM - 2:15 AM UTC
N405 (Lecture Hall North)
[7a-N405-1]Step-height measurement using interferometric microscope on phase-change patterns
〇Kentaro Sugawara1, Tamihiro Gotoh2 (1.NMIJ/AIST, 2.Gunma Univ.)
[7a-N405-2]Transmittance change in In-Se evaporated films at room temperature
〇(M2)Taiyo Hirai1, Tamihiro Gotoh1 (1.Gunma Univ.)
[7a-N405-3]Photoinduced Optical Absorption Edge Shifts in Amorphous Chalcogenide Thin Film at Low Temperature
〇(M1)Yuki Inoue1, Koji Hayashi2 (1.Gifu Univ. Grad Sch., 2.Gifu Univ.)
[7a-N405-4]Fabrication of amorphous ternary Ge-S-Te thin films by vacuum evaporation for the selector application
〇(M1C)Daiki Inose1, Mihyeon Kim1, Shogo Hatayama2, Yuta Saito1,2,3 (1.Tohoku Univ., 2.SFRC, AIST, 3.GXT, Tohoku Univ.)
[7a-N405-5]Dependence on number of RF inputs and frequency in an Ag2Te resistance switching device
〇(M1)Jun Yamasawa1, Yuta Tsuchihashi1, Toshihiro Nakaoka1 (1.Sophia Univ.)
[7a-N405-6]Crystallization Behavior of Sputter-Deposited Amorphous VTe2 Thin Film
〇(M2)Shuhei Orihara1, Yi Shuang1,2, Daisuke Ando1, Yuji Sutou1,2 (1.Tohoku Univ. (Eng), 2.Tohoku Univ. (AIMR))