Session Details
[7p-S202-1~12]23.1 Joint Session N "Informatics"
Sun. Sep 7, 2025 1:00 PM - 4:30 PM JST
Sun. Sep 7, 2025 4:00 AM - 7:30 AM UTC
Sun. Sep 7, 2025 4:00 AM - 7:30 AM UTC
S202 (Lecture Hall South)
[7p-S202-1]Autonomous synthesis of polycrystalline TiO2 thin films with desired crystal structure
〇Sota Hasebe1, Kazunori Nishio5, Akira Aiba2, Yota Suzuki3, Ryo Nakayama1, Tomohito Sudare1, Shigeru Kobayashi1, Ryota Shimizu4, Taro Hitosugi1,5 (1.Univ. Tokyo, 2.Rigaku Corp, 3.CFC, 4.IMS, 5.Science Tokyo)
[7p-S202-2]Application of a Material Structural Similarity Map to Materials Process Exploration
〇Yusuke Hashimoto1, Xue Jia2, Hao Li2, Tomai Takaaki1 (1.FRIS, Tohoku Univ., 2.AIMR, Tohoku Univ.)
[7p-S202-3]Reliable optimization of MOCVD condition of GaN by objective function considering conventional conditions
〇Shota Seki1,2, Fumiaki Mizuno1, Tsuyoshi Matsuoka1, Tsutomu Sonoda3, Tokio Takahashi3, Hisashi Yamada3, Reiko Azumi3, Kentaro Kutsukake2, Toru Ujihara2 (1.Aixtal, 2.Nagoya Univ., 3.AIST)
[7p-S202-4]Experimental demonstration of a data-driven automated floating zone crystal growth furnace using reinforcement learning
〇Sogo Yanagisawa1, Ryohei Matsumoto2, Syogo Sumitani2, Takuya Inagaki3, Eisuke Bannai4, Kentaro Kutsukake1,5, Toru Ujihara1,5, Shunta Harada1,5 (1.Nagoya Univ., 2.Anamorphosis Networks, 3.Sanko, 4.NIMS, 5.IMaSS Nagoya Univ.)
[7p-S202-5]Machine learning model design focusing on error accumulation structure in multi-stage semiconductor manufacturing process
〇Takumi Yamada1, Kentaro Kutsukake1,2, Shunta Harada1,2, Toru Ujihara1,2 (1.Grad. Sch. Eng., Nagoya Univ., 2.IMaSS Nagoya Univ.)
[7p-S202-6]Robust deep learning prediction for physical dynamics with Jacobian oriented regularization
〇Shota Seki1,2, Yuji Nakanishi1, Masaki Takaishi1, Kentaro Kutsukake2 (1.Aixtal, 2.Nagoya Univ.)
[7p-S202-7]Deep Learning-Based Automated Evaluation Pipeline for Semiconductor Etched Geometry
〇Seiyo Nojima1, Kazunori Iwamitsu1, Zentaro Akase1, Akihiko Kikuchi2, Shigetaka Tomiya1 (1.NAIST, 2.Sophia Univ.)
[7p-S202-8]Development of a Bimodal Correlative Microscopy Method Using Three-Dimensional Atom Probe and Transmission Electron Microscopy Analysis
〇Zentaro Akase1, Taisei Bessho1, Yoshito Otake1, Jun Uzuhashi2, Kazunori Iwamitsu1, Hiroshi Nakajima3, Jun Yamasaki3, Tadakatsu Ohkubo2, Shigetaka Tomiya1 (1.NAIST, 2.NIMS, 3.Osaka Univ.)
[7p-S202-9]Deep Learning Ellipsometry: Ultrafast and High-Accuracy Determination of Optical Constants, Thin-Film Structures, and Bandgaps
Ryosuke Oka1, Yuki Yamamoto1, James N. Hilfiker2, Hitoshi Tampo3, Takehiko Nagai3, Masahiro Hayashi1, 〇Hiroyuki Fujiwara1 (1.Gifu Univ., 2.J.A. Woollam Co., 3.AIST)
[7p-S202-10]Study on the Gate Length Dependence of InGaAs-HEMT Device Operation Using Extended Free Energy Model
〇Haruto Nakamura1, Yotaro Machida2, Ryunosuke Nagaoka2, Issei Watanabe3, Masato Kotugi2, Hirokazu Fukidome1 (1.Tohoku Univ., 2.TUS, 3.NICT)
[7p-S202-11]Optimization of Sensor Locations by Kalman Filters in Data Fusion
〇Yasushi Takeuchi1 (1.Aixtal Corp.)
[7p-S202-12]The mechanism of generation of ground-breaking research based on social capital theory
〇Keisuke Shinagawa1 (1.Fukuoka womens Univ.)