The 72nd JSAP Spring Meeting 2025
Advanced Search

Session Details

Oral presentation15 Crystal Engineering : 15.7 Crystal characterization, impurities and crystal defects

[14p-K306-1~3]15.7 Crystal characterization, impurities and crystal defects

Fri. Mar 14, 2025 1:30 PM - 2:15 PM JST
Fri. Mar 14, 2025 4:30 AM - 5:15 AM UTC
K306 (Lecture Hall Bldg.)
Ayumi Hirano(Tohoku Univ.)
1:30 PM - 1:45 PM JST(4:30 AM - 4:45 AM UTC)

[14p-K306-1]Quality of silicon substrate and point defects: 2nd generation
(13) Effect of internal stress on point defects

〇Naohisa Inoue1, Shuichi Kawamata1, Shuichi Okuda1 (1.Osaka Metropolitan Univ. Radiation Research Center)
Comment()
1:45 PM - 2:00 PM JST(4:45 AM - 5:00 AM UTC)

[14p-K306-2]High sensitivity infrared absorption spectroscopy and infrared defect dynamics of silicon crystal/
2-nd generation (26) LVM IR absorption of shallow thermal donor

〇Naohisa Inoue1, Shuichi Kawamata1, Shuichi Okuda1 (1.Osaka Metropolitan Univ. Radiation Research center)
Comment()
2:00 PM - 2:15 PM JST(5:00 AM - 5:15 AM UTC)

[14p-K306-3]Measurement of carbon concentration in silicon crystal/ 2-nd generation
(30) Solution of inner phonon band problem in infrared absorption (2) Liquid N T measurement

〇Naohisa Inoue1, Shuichi Okuda1, Shuichi Kawamata1 (1.Osaka Metropolitan Univ. Radiation Research center)
Comment()
Back to Category List