Presentation Information
[2P21]Assessing Sub-nm Scale Roughness on HOPG Surfaces by Diffraction Spot Profiles in RHEED
*Rivaldo Marsel Tumbelaka1, Yoshihiro kitagawa1, Juharni Juharni1, Toh-ya Fujiwara1, Yasunari Kimoto1, Tsubosaki Kanako1, Azusa N Hattori2, Hiroki Momono3, Ken Hattori1 (1. Nara Institute of Science and Technology, 2. SANKEN, Osaka University, 3. Yonago College)