Session Details
[3F09-12]Surface Analysis
Wed. Oct 22, 2025 1:30 PM - 3:15 PM JST
Wed. Oct 22, 2025 4:30 AM - 6:15 AM UTC
Wed. Oct 22, 2025 4:30 AM - 6:15 AM UTC
F: 202A(2F)
Chair:Yoshimi Abe
The Current State of Inverse Modeling in Surface Analysis
[3F09]Bayesian Inference for Comprehensive and Rapid Crystalline Phase Identification from X-ray diffraction
*Kenji Nagata1, Ryo Murakami1 (1. National Institute for Materials Science)
[3F10]Proposal of an XPS data-driven surrogate model: a novel analysis framework utilizing background information
*Shunichi Yoneda1, Ryo Murakami2, Hiroshi Shinotsuka2, Hideki Yoshikawa2, Shigeo Tanuma2, Hiromi Tanaka3, Hayaru Shouno1, Kenji Nagata2 (1. University of Electro-Communications, 2. National Institute for Materials Science, 3. National Institute of Technology, Yonago College)
[3F11]Applications and prospects of RBS and HFS in Industry
*junichiro sameshima1 (1. Toray Research Center, Inc.)
[3F12]Bayesian approach for time-resolved Si 2p XPS analysis during silicon oxidation
*Hiroshi Shinotsuka1, Kenji Nagata2, Hideki Yoshikawa1, Shuichi Ogawa3, Akitaka Yoshigoe4 (1. Research Network and Facility Services Division, National Institute for Materials Science, 2. Center for Basic Research on Materials, National Institute for Materials Science, 3. College of Industrial Technology, Nihon University, 4. Materials Sciences Research Center, Japan Atomic Energy Agency)