[OS6-2] Understanding and controlling wetting phenomena 2

11:35 AM - 11:50 AM JST(2:35 AM - 2:50 AM UTC)

[OS6-2-03] Development of a High-Spatial-Resolution Fluid Slip Measurement Method Using Atomic Force Microscopy

〇Haruya Ishida¹, Hideaki Teshima¹, Qin-Yi Li¹, Koji Takahashi¹ (1. Kyushu Univ.)

Keywords:

Fluid slip,Atomic force microscopy,Solid-liquid interfaces