Session Details
[18a-C41-1~7]15.6 Group IV Compound Semiconductors (SiC)
Wed. Sep 18, 2024 9:00 AM - 10:45 AM JST
Wed. Sep 18, 2024 12:00 AM - 1:45 AM UTC
Wed. Sep 18, 2024 12:00 AM - 1:45 AM UTC
C41 (Hotel Nikko 4F)
Shohei Hayashi(Toray Research Center)
[18a-C41-1]Comparison of single Shockley-type stacking fault expansion in 4H-SiC under ultraviolet illumination after hydrogen or fluorine ion implantation
〇Johji Nishio1, Chiharu Ota1, Ryosuke Iijima1 (1.Toshiba R&D Center)
[18a-C41-2]Analysis of the Mechanism for Suppressing Stacking Fault Expansion through High-Energy Ion Implantation
〇Shunta Harada1, Hitoshi Sakane2, Masashi Kato3 (1.Nagoya Univ., 2.SHI-ATEX, 3.NITech)
[18a-C41-3]Performance improvement of 3C-SiC photocathodes by growth with a single domain epitaxial layer
〇Masashi Kato1, Kongshik Rho1, Jun Fujita1 (1.NITech)
[18a-C41-4]Effect of Temperature Distribution in Source Powder on Growth Rate of SiC Sublimation Process
〇Shin-ichi Nishizawa1, Wataru Saito1 (1.Kyushu Univ.)
[18a-C41-5]Study on growth rate and impurity concentrations in fluorescent 4H-SiC
〇Takuma Ban1, Shota Akiyoshi1, Taisei Mizuno1, Naoki Takahashi1, Eri Akazawa2, Atsushi Suzuki2, Weifang Lu3, Satoshi Kamiyama1, Tetsuya Takeuchi1, Motoaki Iwaya1 (1.Meijo Univ., 2.E&E evolution Ltd., 3.Xiamen Univ.)
[18a-C41-6]Femtosecond laser irradiation on window-formed SiC diodes for understanding the single-event effects
〇Tomoki Taoka1, Takahiro Makino2, Takuro Tomita1 (1.Tokushima Univ., 2.QST)
[18a-C41-7]Polarization control of SiO2/SiC interfacial single photon source by high oxygen pressure thermal oxidation
〇(M2)Rinku Oyama1, Yasuto Hijikata1 (1.Saitama Univ.)