Session Details
[10p-A33-1~14]3.7 Optical measurement, instrumentation, and sensor
Thu. Sep 10, 2026 2:00 PM - 5:45 PM JST
Thu. Sep 10, 2026 5:00 AM - 8:45 AM UTC
Thu. Sep 10, 2026 5:00 AM - 8:45 AM UTC
A33 (Faculty of Info. Sci. & Tech. Bldg.)
[10p-A33-1]Optimal Implementation of Quantum-Mimetic OCT Based on Spectral Intensity Interferometry
〇Tomohiro Shirai1 (1.AIST)
[10p-A33-2]Speckle Noise Reduction by Structured Light using 2D single-shot OCT
〇Kanta Sato1, Keito Fukuda1, Shuto Onodera1, Tatsutoshi Shioda1 (1.Saitama Univ.)
[10p-A33-3]SD-OCT using sinusoidal phase modulation for biological vibration measurement
〇Ryo Sato1, Fumiaki Nin2, Samuel Choi1 (1.Niigata Univ., 2.Gifu Univ.)
[10p-A33-4]Simultaneous Measurement of Composition and Thickness Using Tomographic Spectroscopy
〇Shuto Onodera1, Bilkis Farjana1, Takahiro Kajiyama1, Satoe Murazawa1, Kanta Sato1, Kengo Takamiya1, Tatsutoshi Shioda1 (1.Saitama Univ.)
[10p-A33-5]Multilayer Tomographic Spectroscopy for Complex Refractometry in SD-OCT
〇BILKIS FARJANA1,2, Shuto Onodera1, Satoe Murazawa1, Takahiro Kajiyama1, Tatsutoshi Shioda1 (1.Saitama Univ., 2.BAIUST)
[10p-A33-6]Single-Channel Polarization Sensitive Optical Coherence Tomography
〇Takumi Abe1, Samuel Choi1, Fumiaki Nin2 (1.Niigata Univ., 2.Gifu Univ.)
[10p-A33-7]Laser Biospeckle and Biospeckle Optical Coherence Tomography for Investigation of Lentil Seed Germination under Simulated Microgravity
〇(B)Saanvi Sarma Durbhaka1, Raja Uma Maheshwari1, Hirofumi Kadano1,2 (1.Shibaura Inst, 2.Saitama Univ.)
[10p-A33-8]Observation of magnetic-field-induced detwinning in EuFe2As2 single crystals
using a polarizing microscope
〇Shigetoshi Tomita1, Ko Sasaki2,3, Souta Takami1, Ryunosuke Takahashi1, Shugo Ikeda1, Kenta Kuroda2,3, Hiroki Wadati1,4 (1.Univ. of Hyogo, 2.Hiroshima Univ., 3.WPI-SKCM2, 4.Osaka Univ.)
[10p-A33-9]Stroboscopic differential interference contrast imaging reveals symmetry-selected nonlinear energy routing in a MEMS resonator
〇Yuko Terasawa1, Qian Liu1, Shumpei Takenaka1, Ya Zhang1 (1.Tokyo Univ. of Agri. & Techno.)
[10p-A33-10]Non-Contact Si Wafer Temperature Measurement during Dry Etching Process using Dusturbance Temperature Cancellation by Dual sensing
〇Sho Fujino1, Tateya Iwamoto2 (1.HORIBA Ltd., 2.HORIBA STEC, Co., Ltd.)
[10p-A33-11]Design of a high-extinction-ratio polarization separation device for Full-Stokes snapshot polarimetry
〇(M2)Yudai Sueda1, Moritsugu Sakamoto1,3, Kohei Noda1,3, Kengo Fujii1, Tomoyuki Sasaki1,3, Nobuhiro Kawatsuki2,3, Hiroshi Ono1,3 (1.Nagaoka Univ. of Tech, 2.Univ. of Hyogo, 3.JST-CREST)
[10p-A33-12]Polarization-Based Detection of Microscopic Surface Scratches Using a Full-Stokes Camera
〇(D)Manning Sun1, Yukitoshi Otani1 (1.Utsunomiya Univ.)
[10p-A33-13]Pinhole detection in opaque containers using polarized light and machine learning
〇KENZO YAMAGUCHI1,2,3, MASAMI SHISHIBORI2, RYO HADA3, TOSHIYUKI KASHIWAGI3, HITOSHI OGAWA3 (1.NIT, Anan College, 2.Tokushima Univ., 3.Tokushima Pref. ITC)
[10p-A33-14]Full Stokes polarimeter using a telescope
〇(M1)Yuta Matsuki1, Manning Sun1, Yukitoshi Otani1 (1.Utsunomiya Univ.)
