Presentation Information
[5P98]Graphical user interface for high-throughput peak fitting by Spectrum adapted ECM algorithm
*Tarojiro Matsumura1, Naoka Nagamura2,3, Shotaro Akaho4, Kenji Nagata2, Yasunobu Ando1 (1. National Institute of Advanced Industrial Science and Technology (AIST), Research Center for Computational Design of Advanced Functional Materials (CD-FMat), 2. National Institute for Materials Science (NIMS), Center for Basic Research on Materials, 3. Faculty of Advanced Engineering, Tokyo University of Science, 4. National Institute of Advanced Industrial Science and Technology (AIST), Human Informatics and Interaction Research Institute (HIIRI))