JVSS 2025
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Session Details

Divisions' sessionsDivision's Session

[1H03-09]Microbeam Analysis (MBA)

Mon. Oct 20, 2025 2:00 PM - 5:15 PM JST
Mon. Oct 20, 2025 5:00 AM - 8:15 AM UTC
H: 303(3F)
Chair:Akichika Kumatani, Takae Takeuchi
SPM and Award lectures
2:00 PM - 2:30 PM JST(5:00 AM - 5:30 AM UTC)

[1H03]Probing Electrochemical Mechanisms in 2D van der Waals Heterostructures via Multiple Scanning Probe Microscopy

*He-Yun Du1,2,3 (1. Chemical Engineering Department, Ming Chi University of Technology, 2. Battery Research Center of Green Energy, Ming Chi University of Technology, 3. R&D Center of Biochemical Engineering Technology, Ming Chi University of Technology)
2:30 PM - 3:00 PM JST(5:30 AM - 6:00 AM UTC)

[1H04]Three-dimensional electromagnetic calculations of frontal illumination TERS with a thin-film plasmonic waveguide probe

*Kei Kobayashi1 (1. Kyoto University)
3:00 PM - 3:30 PM JST(6:00 AM - 6:30 AM UTC)

[1H05]Development of electrochemical tip-enhanced Raman spectroscopy toward molecular-scale understanding and control of electrochemical interfaces

*Yasuyuki Yokota1 (1. RIKEN)
3:30 PM - 4:00 PM JST(6:30 AM - 7:00 AM UTC)

[1H06]Energy Conversion at Electrode–Electrolyte Interfaces: Insights from Scanning Probe Microscopy

*Taketoshi Minato1 (1. Institute for Molecular Science, National Institutes of Natural Sciences)
4:00 PM - 4:15 PM JST(7:00 AM - 7:15 AM UTC)

Award ceremony

4:15 PM - 4:45 PM JST(7:15 AM - 7:45 AM UTC)

[1H07【榊賞受賞講演】]Development of Advanced Electron Holography for 3D and Atomic Level Electromagnetic Field Observations

*Toshiaki Tanigaki1 (1. Research & Development Group, Hitachi, Ltd.)
4:45 PM - 5:00 PM JST(7:45 AM - 8:00 AM UTC)

[1H08【榊奨励賞受賞講演】]Development of surface and interface analysis techniques integrating multi-dimensional spectromicroscopy and machine learning

*Naoka Nagamura1,2,3 (1. National Institute for Materials Science, 2. Tokyo University of Science, 3. Tohoku University)
5:00 PM - 5:15 PM JST(8:00 AM - 8:15 AM UTC)

[1H09【榊技術賞受賞講演】]Development of Solid Surface Evaluation Techniques Using High-Speed AES Spectrum Imaging

*Konomi Ikita1, Fuyuki Nabeshima1, Tatsuya Uchida1, Akihiro Tanaka1, Toshiyuki Ohama1, Kazushiro Yokouchi1, Noboru Taguchi1, Kenichi Tsutsumi1 (1. JEOL Ltd.)
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