Session Details
[1A04-09]Probe Microscopy
Tue. Sep 15, 2026 2:00 PM - 5:00 PM JST
Tue. Sep 15, 2026 5:00 AM - 8:00 AM UTC
Tue. Sep 15, 2026 5:00 AM - 8:00 AM UTC
A: Convention Hall (1F)
Chair:Jo Onoda, Yoshiaki Sugimoto
Atomic-Scale Analysis of Semiconductor Surfaces Using a Scanning Probe Microscope
[1A04]Analysis of individual trap levels at semiconductor interfaces using dissipation force microscopy
Takahiro Ono1, Mizuki Ohashi2, Tomohiro Shigeno1, Yutaro Uchida1, Yuuki Yasui1, Koji Kita1, *Yoshiaki Sugimoto1 (1. Graduate School of Frontier Sciences, The University of Tokyo (Japan), 2. Graduate School of Engineering, The University of Tokyo (Japan))
[1A05【依頼講演】]Atomic-scale manipulation of single impurity quantum states in narrow-gap semiconductor InAs using scanning tunneling microscope
*Kiyoshi Kanisawa1 (1. NTT Basic Research Laboratories (Japan))
[1A06【依頼講演】]Atomic-scale analysis of the oxidized rutile TiO2 (110) surface using non-contact atomic force microscopy
*Yuuki Adachi1 (1. The University of Tokyo (Japan))
Break time
[1A07【依頼講演】]Electrical Characterization and Control of Silicon Surface Atomic Structures by Two-probe STM
*Jo Onoda1, Ali Khademi2, Lucian Livadaru3, Robert Wolkow3, Jason Pitters4 (1. University of Teacher Education Fukuoka (Japan), 2. Sharif University of Technology (Iran), 3. University of Alberta (Canada), 4. National Research Council Canada (Canada))
[1A08【依頼講演】]Metallic States Emerging at Surface and Interfaces of β-FeSi2/Si(001)
*Keisuke Sagisaka1 (1. National Institute for Materials Science (NIMS) (Japan))
[1A09【依頼講演】]Visualization of molecular orbitals in organic semiconductor thin films
*Yoichi Yamada1 (1. University of Tsukuba (Japan))
