Session Details

[M-4]Wide Bandgap Materials

Tue. Sep 3, 2024 10:45 AM - 12:00 PM JST
Tue. Sep 3, 2024 1:45 AM - 3:00 AM UTC
Room M (Special Conference Room)(4th Floor)
Session Chair: Akihiko Kikuchi (Sophia Univ.), Yu-Lun Chueh (National Tsing‐Hua Univ.)

[M-4-01 (Invited)]Metrology informatics on semiconductor
~ Multimodal analysis of gallium nitride as examples ~

〇Shigetaka Tomiya1 (1. NAIST (Japan))

[M-4-02]Realization of GaN-Drain at Si (100) n-MOS with High Field Effect Mobility

〇Cheng-Jun Huang1, Shuo Hwai2, Tsai-Fu Chung1, Chien-Nan Hsiao3, Edward. Yi Chang2, Mau-Chung Frank Chang1 (1. National Yang Ming Chiao Tung Univ. (Taiwan), 2. Univ. of California, Los Angeles (United States of America), 3. National Applied Res. Labs., Taiwan Instrument Res. Inst. (Taiwan))

[M-4-03]Effects of Al2O3/SiO2 double layer mask on nanotrench etching of GaN by hydrogen environment anisotropic thermal etching (HEATE)

〇Shuya Sato1, Yuki Takahashi1, Tomoaki Momma1, Akihiko Kikuchi1,2,3 (1. Sophia Univ. (Japan), 2. Sophia Photonics Res. Center (Japan), 3. Sophia Semiconductor Research Inst. (Japan))

[M-4-04]Improvement of Fabrication Process for Top-down GaN Nanowires Using Contactless Photo-assisted Electrochemical Etching

〇Hisahiro Furuuchi1,2, Taketomo Sato2, Junichi Motohisa1,2 (1. Graduate School of Info. Sci. and Tech., Hokkaido Univ. (Japan), 2. Res. Center for Integrated Quantum Electronics, Hokkaido Univ. (Japan))