セッション詳細
[15a-70A_101-1~7]原子層プロセス(ALP:Atomic Layer Process)の解析技術と応用技術(3)
2026年3月15日(日) 9:00 〜 12:20
70A_101 (70周年記念講堂)
[15a-70A_101-1]オープニング
〇霜垣 幸浩1 (1.東大)
[15a-70A_101-2]Establishing High-Temperature Area Selective ALD Process through Surface Inhibition
〇Haonan Liu1, Ken Okoshi1, Hiroki Murakami1, Yamato Tonegawa1 (1.TEL TTS)
[15a-70A_101-3]Thin film atomic layer deposition and selective processes
〇Rong Chen1 (1.Huazhong University of Science and Technology)
[15a-70A_101-4]New Paradigms in Atomic Layer Deposition for 3D Semiconductor Device Fabrication
〇Han-Bo-Ram Lee1,2 (1.Incheon National University, 2.ACS Publications)
[15a-70A_101-5]Ultra-High Aspect Ratio Test Structures in ALP Process Analytics
〇Mikko Utriainen1 (1.Chipmetrics Ltd)
[15a-70A_101-6]Development of Atomic Layer Deposition and Atomic Layer Etching Processes for Semiconductor Device Fabrication using In Situ Diagnostics
〇Sumit Agarwal1 (1.Colorado Sch Mines)
[15a-70A_101-7]Plasma-Based Atomic Layer Etching for Atomic-Scale Semiconductor Device Fabrication
〇Heeyeop CHAE1 (1.Sungkyunkwan Univ. (SKKU))
