セッション詳細

[15a-70A_101-1~7]原子層プロセス(ALP:Atomic Layer Process)の解析技術と応用技術(3)

2026年3月15日(日) 9:00 〜 12:20
70A_101 (70周年記念講堂)

[15a-70A_101-1]オープニング

〇霜垣 幸浩1 (1.東大)

[15a-70A_101-2]Establishing High-Temperature Area Selective ALD Process through Surface Inhibition

〇Haonan Liu1, Ken Okoshi1, Hiroki Murakami1, Yamato Tonegawa1 (1.TEL TTS)

[15a-70A_101-3]Thin film atomic layer deposition and selective processes

〇Rong Chen1 (1.Huazhong University of Science and Technology)

[15a-70A_101-4]New Paradigms in Atomic Layer Deposition for 3D Semiconductor Device Fabrication

〇Han-Bo-Ram Lee1,2 (1.Incheon National University, 2.ACS Publications)

[15a-70A_101-5]Ultra-High Aspect Ratio Test Structures in ALP Process Analytics

〇Mikko Utriainen1 (1.Chipmetrics Ltd)

[15a-70A_101-7]Plasma-Based Atomic Layer Etching for Atomic-Scale Semiconductor Device Fabrication

〇Heeyeop CHAE1 (1.Sungkyunkwan Univ. (SKKU))