Session Details
[10p-N401-1~7]13.3 Insulator technology
Wed. Sep 10, 2025 1:30 PM - 3:15 PM JST
Wed. Sep 10, 2025 4:30 AM - 6:15 AM UTC
Wed. Sep 10, 2025 4:30 AM - 6:15 AM UTC
N401 (Lecture Hall North)
[10p-N401-1]Demonstration of ALD-HKMG Ge MOS structures for Ge (111) GAA nFETs
〇Keisei Kawana1,2, Noboru Fukuhara1, Wen Hsin Chang1, Chia Tsong Chen1, Toshiyuki Tsutsumi1,2, Tatsuro Maeda1 (1.AIST, 2.Meiji Univ.)
[10p-N401-2]Evaluation of Slow Traps at the Al2O3/Ge MOS Interface Formed by Ozone Oxidation
〇Daiki Takahashi1, Xiao Yu2, Nobuyuki Aoki1, Mengnan Ke3 (1.Chiba Univ., 2.Xidian Univ., 3.Yokohama National Univ.)
[10p-N401-3]Study on the preparation of GeO2/Ge structures using Caro's acid
〇Hoshiki Harata1, Yoshitaka Iwazaki1, Tomo Ueno1 (1.Tokyo Univ. of Agri. and Tech.)
[10p-N401-4]Study on the improvement of GeO2/Ge interface properties by N2 annealing treatment
〇Yuya Kozaki1, Yoshitaka Iwazaki1, Tomo Ueno1 (1.Tokyo Univ. of Agri. and Tech.)
[10p-N401-5]Two-step deposition and characterization of ultrathin GeO2/Ge interfaces
〇Hiroki Inoue1, Suzuki Takumi1, Yoshitaka Iwasaki1, Tomo Ueno1, Mitaro Namiki1 (1.Tokyo univ. of Agri & Tech)
[10p-N401-6]Preparation and evaluation of GeO2/Ge structure using CVD method.
〇Takumi Suzuki1, Hiroki Inoue1, Yoshitaka Iwazaki1, Tomo Ueno1 (1.Tokyo Univ. Agri. & Tech.)
[10p-N401-7]Research on Ge-MOS structure using high dielectric constant materials TiO2
〇Yota Uchida1, Yositaka Iwazaki1, Tomo Ueno1 (1.Tokyo univ. of Agri & Tech)