Session Details
[14a-P02-1~6]7 Beam Technology and Nanofabrication (Poster)
Fri. Mar 14, 2025 9:30 AM - 11:30 AM JST
Fri. Mar 14, 2025 12:30 AM - 2:30 AM UTC
Fri. Mar 14, 2025 12:30 AM - 2:30 AM UTC
P02 (Gymnasium)
[14a-P02-1]Schwarzschild Objective for Interference Microscopy in Soft-X-Ray Region
〇(B)Yuta Fujisawa1, Tetsuya KUREMATSU1, Mitsunori TOYODA1, Masahiko ISHINO2 (1.Tokyo Polytechnic Univ., 2.QST)
[14a-P02-2]Development of XAFS/XAFS imaging method for dilute sample in actual devices
〇Tomoya Uruga1, Takuma Kaneko1 (1.JASRI)
[14a-P02-3]Dip and pull set up for oxygen evolution reaction under vapor reaction conditions at the BL46XU beamline of SPring-8
〇Okkyun Seo1, Yasumasa Takagi1, Satoshi Yasuno1, Tappei Nishihara1 (1.JASRI)
[14a-P02-4]Dopant occupation site analysis in Ag-Ba-Si alloys using high-angular resolution electron channeling X-ray spectroscopy
〇Ken Matsumura1, Ryo Akiike2, Masami Mesuda2, Masahiro Ohtsuka3 (1.Tosoh Analysis and Research Center, 2.Tosoh, 3.Nagoya Univ. IMaSS)
[14a-P02-5]Improvement of sensitivity characteristics of negative electron beam resist
by UVC irradiation
〇Shigeo Tamura1, Yasuyuki Miyamoto1,2 (1.Science Tokyo,FIRST, 2.Science Tokyo)
[14a-P02-6]Guiding effect of different multi-charge ion beams with a same specific charge in cylindrical glass channels
〇Mari Yuasa1, Kenji Motohashi1 (1.Grad. Sch. Life Sci., Toyo Univ.)