Session Details
[10p-B12-1~7]KS5 Atomic Layer Process Group
Thu. Sep 10, 2026 2:00 PM - 3:45 PM JST
Thu. Sep 10, 2026 5:00 AM - 6:45 AM UTC
Thu. Sep 10, 2026 5:00 AM - 6:45 AM UTC
B12 (Faculty of Engineering B Block)
[10p-B12-1]Imaging Ellipsometry with LHAR Test Structure for Characterizing ALD-Al2O3 Film Conformality
〇Hiroshi Nishizato1, Ishida Kanta1, Nakaya Yugo2, Nasu Kinichi3, Hirayama Mikiro3, Jin Lianhua4, Momose Takeshi3 (1.GSST, Kumamoto Univ., 2.HORIBA STEC, 3.REISI, Kumamoto Univ., 4.Univ. of Yamanashi)
[10p-B12-2]Direct Observation of the Initial Oxidation Process in TDMAS/O3 SiO2 ALD by in-situ XPS
〇(D)Yuuki Tsuchiizu1, Daisuke Ohori2, Teruhisa Ohtsuka3, Masashi Ymazaki3, Hiroshi Arimoto3, Kazuhiko Endo1 (1.Inst. of Fluid Sci. Tohoku Univ., 2.Kansai Univ., 3.Natl. Inst. of Adv. Ind. Sci. and Technol.)
[10p-B12-3]Development of Area Selective Deposition using iCVD
〇Kazuya Ichiki1, Shuji Azumo1 (1.Tokyo Electron Technology Solutions Ltd)
[10p-B12-4]Design of optimal inhibitors for area-selective atomic layer deposition by means of random sequential adsorption simulations
〇Haruhide Miyagi1, Shogo Shimada1, Atsuro Seino1, Kimihiko Nakatani1, Hajime Karasawa1, Takafumi Sasaki1 (1.KOKUSAI ELECTRIC CORPORATION)
[10p-B12-5]Adsorption Stabilization of Metal Surfaces and Inhibition of ALD TaN Growth by An Original Self-Assembled Monolayer
〇Hiroyuki Komatsu1, Yoshifuru Shibata1, Noriaki Wakabayashi1, Yasutaka Kamei1, Souichiro Akagi2, Kouta Yokoyama2, Yugo Tai2 (1.JSR, 2.JEMT)
[10p-B12-6]Selectivity Control in SiN-ALD Using Hydrazine and Inhibitor
〇Hayato Murata1,2, Kousuke Ohyama2, Mikiko Hasegawa2, Tadamoto Anzai2, Hideharu Shimizu2, Mikiro Hirayama3, Takeshi Momose3 (1.GSST, Kumamoto Univ., 2.NIPPON SANSO, 3.SE, Kumamoto Univ.)
[10p-B12-7]Study on Mo Bottom-up Filling Process using Inhibitor
〇Soga Nagai1, Noboru Sato1, Yuhei Otaka1, Naoki Tamaoki1, Atsuhiro Tsukune1, Yukihiro Shimogaki1 (1.Univ. Tokyo)
