Session Details

[16a-W2_401-1~9]15.4 III-V-group nitride crystals

Mon. Mar 16, 2026 9:00 AM - 11:30 AM JST
Mon. Mar 16, 2026 12:00 AM - 2:30 AM UTC
W2_401 (West Bldg. 2)

[16a-W2_401-1][The 47th Young Scientist Award Speech] High-current, high-voltage AlN Schottky Barrier Diodes

〇Cristyan Quinones1, Dolar Khachariya2, Pramod Reddy2, Seiji Mita2, Jack Almeter1, Pegah Bagheri1, Shashwat Rathkanthiwar1, Ronny Kirste2, Spyridon Pavlidis1, Erhard Kohn1, Ramon Collazo1, Zlatko Sitar1,2 (1.North Carolina State University, 2.Adroit Materials)

[16a-W2_401-2]Fabrication of Al-rich AlGaN HEMTs using a heavily Si-doped AlN barrier

〇Takao Kozaka1, Kohei Ueno1, Hiroshi Fujioka1 (1.IIS)

[16a-W2_401-3]Relationship between AlN Composition Gradient in the GaN Channel and Leakage Current in N-Polar GaN HEMT Structures

〇(DC)Aina Hiyama Zazuli1, Ryosuke Ninoki1, Fumiya Yamanaka1, Taisei Kimoto1, Haruki Danbata1, Nobuteru Hirata1, Amane Hayashiuchi1, Yuuya Kitamura1, Kei Sunai1, Rinne Abe1, Haruka Tokumoto1, Satoshi Kurai1, Narihito Okada1, Yoichi Yamada1 (1.Grad. School of Sci. & Tech. for Innovation, Yamaguchi Univ.)

[16a-W2_401-4]Dependence of 2-dimensional electron gas mobility on temperature and carrier concentration: Evidence of carrier-carrier scattering

〇Markus Pristovsek1, Yoann Robin1, Itsuki Furuhashi1 (1.IMASS, Nagoya Univ.)

[16a-W2_401-5]Analysis of Surface Defects on AlN Templates Affecting Leakage Current in n-AlGaN

〇Hiroki Yasunaga1,2, Ryota Akaike2,3, Koki Mizutani3, Takao Nakamura2,3, Hideto Miyake2,3 (1.Mie Univ. ORIP, 2.Mie Univ. IC-SDF, 3.Mie Univ. Grad. Sch. of Eng.)

[16a-W2_401-6]Growth of AlGaN using MOVPE-AlN Template on Sputtered AlN

〇(M2)Yuto Matsubara1, Koki Fujii1, Yusuke Takayanagi1, Yukiya Hayashi1, Soki Shimizu1, Yuki Kuwahara1, Kota Matsuo1, Yuusuke Takashima1,2, Yoshiki Naoi1,2, Ibuki Taniuchi4, Shohei Nakamura4, Atsushi Maeoka4, Atsushi Osawa4, Shigeru Takatsuji4, Takahiro Kimura4, Kentaro Nagamatsu1,2,3 (1.Faculty of Science and Engineering, Tokushima Univ., 2.pLED, Tokushima Univ., 3.IPHF, Tokushima Univ., 4.SCREEN Holdings Co., Ltd.)

[16a-W2_401-7]Comparison of Electrical Properties of Electrochemically Energized n-GaN and AlGaN/GaN Heterostructures

〇Ren Morita1, Riku Ando1, Hiroshi Fujioka2, Narihiko Maeda1 (1.Tokyo Univ. of Technology, 2.Inst. of Industrial Science, Univ. of Tokyo)

[16a-W2_401-8]Planarization of {11-22} AlN using H2 pulsed etching in metal-organic vapor phase epitaxy

〇(M1)Takahiro Sumino1, Satoshi Kurai1, Narihito Okada1, Youichi Yamda1 (1.Grad. School of Sci. & Tech. for Innovation, Yamaguchi Univ.)

[16a-W2_401-9]In situ sputtered metal contacts on pulsed-sputtered n-type AlGaN

〇Aiko Naito1, Kohei Ueno1, Hiroshi Fujioka1 (1.IIS, Utokyo)