Session Details

[23a-52A-1~9]15.6 Group IV Compound Semiconductors (SiC)

Sat. Mar 23, 2024 9:00 AM - 11:30 AM JST
Sat. Mar 23, 2024 12:00 AM - 2:30 AM UTC
52A (Building No. 5)
Chiharu Ota(東芝)

[23a-52A-1]Formation of Alternating Epitaxial Stacked Structures of 3C-SiC and 4H-SiC

〇Hiroyuki Nagasawa1, Michimasa Musya2, Masao Sakuraba2, Shigeo Sato2 (1.CUSIC Inc., 2.Tohoku Univ. RIEC)

[23a-52A-2]Numerical Investigation on Critical Conditions for the Step Instability in Solution Growth of SiC

〇Xin Liu1, Toru Ujihara1 (1.IMaSS Nagoya Univ.)

[23a-52A-3]Effect of Growth Pressure and Temperature on Growth Rate of SiC Sublimation Process

〇Shin-ichi Nishizawa1, Wataru Saito1 (1.Kyushu Univ.)

[23a-52A-4]Optimization of impurity concentrations in fluorescent SiC doped with boron and nitrogen

〇Takuma Ban1, Shota Akiyoshi1, Taisei Mizuno1, Naoki Takahashi1, Eri Akazawa2, Atsushi Suzuki2, Weifang Lu3, Satoshi Kamiyama1, Tetsuya Takeuchi1, Motoaki Iwaya1 (1.Meijo Univ., 2.E&E Evolution Ltd., 3.Xiamen Univ.)

[23a-52A-5]Optical properties on hybrid-type white LED using porous and fluorescent SiC

〇(M1)Taisei Mizuno1, Shota Akiyoshi1, Naoki Takahashi1, Takuma Ban1, Tetsuya Takeuchi1, Motoaki Iwaya1, Satoshi Kamiyama1, Atsushi Suzuki2, Eri Akazawa2, Yiyu Ou3, Haiyan Ou3, Jiachen Wang3 (1.Meijo Univ., 2.E&E Corp., 3.Technical Univ. Denmark)

[23a-52A-6]Density control of single-photon sources formed at a SiO2/SiC interface

〇Mitsuaki Kaneko1, Hideaki Takashima1,2, Konosuke Shimazaki1, Shigeki Takeuchi1, Tsunenobu Kimoto1 (1.Kyoto Univ., 2.CIST)

[23a-52A-7]ODMR characteristics of silicon vacancies in isotopically purified 4H-SiC

〇Kosuke Yamashiro1,2, Shin-ichiro Sato2, Koichi Murata3, Masafumi Hanawa3, Shengjie Zhang1,2, Yuichi Yamazaki2, Hidekazu Tsuchida3, Yasuto Hijikata1, Takeshi Ohshima2 (1.Saitama Univ., 2.QST, 3.CRIEPI)

[23a-52A-8]Reduction of 1SSF expansion rate of basal plane dislocation in 4H-SiC under UV illumination after hydrogen ion implantation

〇Johji Nishio1, Chiharu Ota1, Ryosuke Iijima1 (1.Toshiba R&D Center)

[23a-52A-9]Impacts of single Shockley-type stacking faults in blocking-voltage layer on electrical characteristics of 4H-SiC PiN diodes

〇Satoshi Asada1, Koichi Murata1, Hidekazu Tsuchida1 (1.CRIEPI)