Session Details
[17a-S4_203-1~11]13.1 Fundamental properties, surface and interface, and simulations of Si related materials
Tue. Mar 17, 2026 9:00 AM - 12:00 PM JST
Tue. Mar 17, 2026 12:00 AM - 3:00 AM UTC
Tue. Mar 17, 2026 12:00 AM - 3:00 AM UTC
S4_203 (South Bldg. 4)
[17a-S4_203-1]Investigation of structural evaluation methods for amorphous SiO2 thin films on Si substrates using X-ray and electron PDF analysis
〇Takanori Itoh1, Shusaku Ogyu1, Toshihiro Asada1, Yuji Shiramata2,3, Koji Ohara3 (1.NISSAN ARC, LTD., 2.Rigaku, 3.Shimane Univ.)
[17a-S4_203-2]Analysis of the initial oxidation process on TiN surface by first-principles calculations
-Termination structure on surface and influence of N vacancy-
〇Yo Matsunaga1, Kenta Arima1, Kouji Inagaki1 (1.U Osaka)
[17a-S4_203-3]Ar/N2 gas flow ratio dependence on the ferroelectric HfNx formation utilizing ECR-plasma sputtering
〇KANGBAI LI1, Shun-ichiro Ohmi1 (1.Science Tokyo)
[17a-S4_203-4]Shell Thickness Dependence of the Optical Bandgap of ZnSe/ZnS Core/Shell Quantum Dots: Tight-Binding Analysis
〇Jinhyong Lim1, Nobuya Mori1 (1.UOsaka)
[17a-S4_203-5]Study of Micro-electrode Patterns on the Control of the Electroplated Metal Deposition toward MEMS Device Fabrication
〇Kota Sakanashi1, Tomoyuki Kurioka1, Katsuyuki Machida1, Chen Chun-Yi1, Chang Tso-Fu Mark1, Yoshihiro Miyake1, Hiroyuki Ito1, Masato Sone1 (1.Science Tokyo)
[17a-S4_203-6]Quantum Transport Simulation with Dissipation and Scattering Using Quantum Circuits
〇SATOFUMI SOUMA1 (1.Kobe Univ.)
[17a-S4_203-7]Nonewuilibrium Green Function Simulation of Impact Ionization in a One-Dimensonal Model
〇Kazuma Takaoka1, Hajime Tanaka1,2, Nobuya Mori1 (1.Osaka Univ., 2.Kwansei Univ.)
[17a-S4_203-8]Theoretical Calculation of Mobility Anisotropy in (111) Ge Double-Gate MOSFETs
〇Koichi Fukuda1, Junichi Hattori1, Tatsuro Maeda1 (1.AIST)
[17a-S4_203-9]Development of a Three-Dimensional Monte Carlo Device Simulator with Online Machine Learning for Enhanced Generality
〇(M1)Yusuke Otsuki1, Nobuya Mori1 (1.Osaka Univ.)
[17a-S4_203-10]Simulation and Modelling of Single Event Upset in CFET SRAM
〇(BC)Vanness Filbert Cierra1, Yoshinari Kamakura1 (1.Osaka Inst. Tech.)
[17a-S4_203-11]Reconsideration of Misconception of Drain Current Saturation for MOSFETs
〇Naoyuki Shigyo1 (1.Free Engineer)
