Session Details
[10p-N302-1~11]13.5 Semiconductor devices/ Interconnect/ Integration technologies
Wed. Sep 10, 2025 1:30 PM - 4:30 PM JST
Wed. Sep 10, 2025 4:30 AM - 7:30 AM UTC
Wed. Sep 10, 2025 4:30 AM - 7:30 AM UTC
N302 (Lecture Hall North)
[10p-N302-1]Optimized design of embedded flash memory using standard logic transistors
〇HIROSHIGE HIRANO1, ATSUSHI NOMA1, HIROAKI KURIYAMA1 (1.Tower Partners Semiconductor)
[10p-N302-2]Design of asymmetric SRAM cell for energy-minimum-point operation
〇Ryo Fujishita1, Yusaku Shiotsu1, Satoshi Sugahara1 (1.FIRST, Inst. of Sci. Tokyo)
[10p-N302-3]A high-noise-immunity SRAM cell for energy-minimum-point-operation PIMs
Katsutoshi Ito1, 〇Takuma Fujiwara1, Yusaku Shiotsu1, Satoshi Sugahara1 (1.FIRST, Inst. of Sci. Tokyo)
[10p-N302-4]A parallel-processing-in-memory BNN accelerator macro using XNOR-SRAM
〇Kein Kondo1, Yusaku Shiotsu1, Satoshi Sugahara1 (1.FIRST, Inst. of Sci. Tokyo)
[10p-N302-5]Design and performance of single-ended SRAM cells for near energy-minimum-point operation
〇Tadakatsu Yaguchi1, Yusaku Shiotsu1, Satoshi Sugahara1 (1.FIRST, Inst. of Sci. Tokyo)
[10p-N302-6]Design methodology for a radiation-hardened SRAM cell
〇Toshiki Nomiyama1, Yusaku Shiotsu1, Satoshi Sugahara1 (1.FIRST, Inst. of Sci. Tokyo)
[10p-N302-7]Evaluation of hard mask transfer etching of HP19 nm L/S patterns in nanoimprint lithography
〇Kenta Suzuki1, Tetsuya Ueda1, Yuji Kasashima1, Hamamoto Ryosuke1, Masanaga Fukasawa1, Wataru Mizubayashi1, Yoshihiro Hayashi1, Masaki Ishida2, Tomomi Funayoshi2, Hiromi Hiura2, Masayuki Kagawa2, Noriyasu Hasegawa2, Kiyohito Yamamoto2 (1.SFRC, AIST, 2.Canon)
[10p-N302-8]Evaluation of dual damascene patterning by nanoimprint lithography
〇Ryosuke Hamamoto1, Kenta Suzuki1, Tetsuya Ueda1, Yoshihiro Hayashi1, Wataru Mizubayashi1, Masaki Ishida2, Hiromi Hiura2, Masayuki Kagawa2, Atushi Kusaka2, Makoto Ogusu2, Kiyohito Yamamoto2 (1.AIST SFRC, 2.Canon)
[10p-N302-9]Atomistic Simulation of Increase in Resistance of Oxidized CuAl2 Films
〇Takahisa Tanaka1 (1.Keio Univ.)
[10p-N302-10]Fabrication of CoSn kagome metal thin films for interconnect applications
〇Tomoya Nakatani1, Nattamon Suwannaharn1, Taisuke Sasaki1 (1.NIMS)
[10p-N302-11]Electromigration characteristics of NiAl
〇Shuhei Yonehara1, Junichi Koike1 (1.Tohoku Univ.)