Session Details

[10p-N302-1~11]13.5 Semiconductor devices/ Interconnect/ Integration technologies

Wed. Sep 10, 2025 1:30 PM - 4:30 PM JST
Wed. Sep 10, 2025 4:30 AM - 7:30 AM UTC
N302 (Lecture Hall North)

[10p-N302-1]Optimized design of embedded flash memory using standard logic transistors

〇HIROSHIGE HIRANO1, ATSUSHI NOMA1, HIROAKI KURIYAMA1 (1.Tower Partners Semiconductor)

[10p-N302-2]Design of asymmetric SRAM cell for energy-minimum-point operation

〇Ryo Fujishita1, Yusaku Shiotsu1, Satoshi Sugahara1 (1.FIRST, Inst. of Sci. Tokyo)

[10p-N302-3]A high-noise-immunity SRAM cell for energy-minimum-point-operation PIMs

Katsutoshi Ito1, 〇Takuma Fujiwara1, Yusaku Shiotsu1, Satoshi Sugahara1 (1.FIRST, Inst. of Sci. Tokyo)

[10p-N302-4]A parallel-processing-in-memory BNN accelerator macro using XNOR-SRAM

〇Kein Kondo1, Yusaku Shiotsu1, Satoshi Sugahara1 (1.FIRST, Inst. of Sci. Tokyo)

[10p-N302-5]Design and performance of single-ended SRAM cells for near energy-minimum-point operation

〇Tadakatsu Yaguchi1, Yusaku Shiotsu1, Satoshi Sugahara1 (1.FIRST, Inst. of Sci. Tokyo)

[10p-N302-6]Design methodology for a radiation-hardened SRAM cell

〇Toshiki Nomiyama1, Yusaku Shiotsu1, Satoshi Sugahara1 (1.FIRST, Inst. of Sci. Tokyo)

[10p-N302-7]Evaluation of hard mask transfer etching of HP19 nm L/S patterns in nanoimprint lithography

〇Kenta Suzuki1, Tetsuya Ueda1, Yuji Kasashima1, Hamamoto Ryosuke1, Masanaga Fukasawa1, Wataru Mizubayashi1, Yoshihiro Hayashi1, Masaki Ishida2, Tomomi Funayoshi2, Hiromi Hiura2, Masayuki Kagawa2, Noriyasu Hasegawa2, Kiyohito Yamamoto2 (1.SFRC, AIST, 2.Canon)

[10p-N302-8]Evaluation of dual damascene patterning by nanoimprint lithography

〇Ryosuke Hamamoto1, Kenta Suzuki1, Tetsuya Ueda1, Yoshihiro Hayashi1, Wataru Mizubayashi1, Masaki Ishida2, Hiromi Hiura2, Masayuki Kagawa2, Atushi Kusaka2, Makoto Ogusu2, Kiyohito Yamamoto2 (1.AIST SFRC, 2.Canon)

[10p-N302-9]Atomistic Simulation of Increase in Resistance of Oxidized CuAl2 Films

〇Takahisa Tanaka1 (1.Keio Univ.)

[10p-N302-10]Fabrication of CoSn kagome metal thin films for interconnect applications

〇Tomoya Nakatani1, Nattamon Suwannaharn1, Taisuke Sasaki1 (1.NIMS)

[10p-N302-11]Electromigration characteristics of NiAl

〇Shuhei Yonehara1, Junichi Koike1 (1.Tohoku Univ.)