Session Details
[9p-B11-1~11]21.1 Joint Session K "Wide bandgap oxide semiconductor materials and devices"
Wed. Sep 9, 2026 4:00 PM - 7:00 PM JST
Wed. Sep 9, 2026 7:00 AM - 10:00 AM UTC
Wed. Sep 9, 2026 7:00 AM - 10:00 AM UTC
B11 (Faculty of Engineering B Block)
[9p-B11-1]Solid phase epitaxy of rutile-type GeO2 films under high pressure
〇Keiji Shibata1, Ryota Noda1, Fumio Kawamura2, Hitoshi Yusa2, Masashi Miyakawa2, Naoomi Yamada1 (1.Chubu Univ., 2.NIMS)
[9p-B11-2]Electrical transport properties of Sb-doped rutile-type GeO2 thin films synthesized by solid-phase epitaxy
〇(M2)Shohei Osawa1, Hiroaki Hanafusa2, Daichi Oka1, Yasushi Hirose1 (1.Tokyo Metropolitan Univ., 2.Hiroshima Univ.)
[9p-B11-3]Temperature Dependence of Crystal Phase Formation in GeO2 Growth by Oxide Vapor Phase Epitaxy
〇Haru Nakano1, Shigeyoshi Usami1, Masayuki Imanishi1, Yusuke Mori1 (1.UOsaka)
[9p-B11-4]Hydrogen Doping and Ion Conduction in Rutile-type GeO2 via Hydrogen Plasma Treatment
〇Tomoya Suzuki1, Keisuke Ide1, Takayoshi Katase1,2, Hidenori Hiramatsu1,2, Hideo Hosono1, Toshio Kamiya1 (1.MDXES, Science Tokyo, 2.MSL, Science Tokyo)
[9p-B11-5]Formation and evaluation of n-type conductive films on r-GeO2 bulk substrates
〇Kentaro Kawanishi1, Yuri Shimizu1, Toyosuke Ibi1, Shinpei Matsuda1 (1.Patentix Inc.)
[9p-B11-6]Investigation of the Phase Stabilization of Rutile GeO2 via Lattice Mismatch Engineering
〇Kazuki Shimazoe1, Masashi Kato1 (1.Nagoya Inst. Tech.)
[9p-B11-7]Effect of growth temperature on the growth of r-GeO2(101) thin films by Mist CVD
〇Naoki Kita1, Ichiro Seike1, Hiroki Miyake1,2, Hiroyuki Nishinaka1 (1.Kyoto Inst. Tech, 2.MIRISE Technologies Corp.)
[9p-B11-8]Controlling the Conductivity of Sb-doped r-GeO2 thin films by Mist CVD
〇Ichiro Seike1, Hiroki Miyake1,2, Hiroyuki Nishinaka1 (1.Kyoto Inst.Tech, 2.MIRISE Tech Corp.)
[9p-B11-9]Infrared reflectance spectroscopy of r-GeO2 epilayers on sapphire substrates
〇Kazutaka Kanegae1, Naoki Kita1, Ichiro Seike1, Hiroyuki Nishinaka1 (1.Kyoto Inst. of Tech.)
[9p-B11-10]Vertical Schottky barrier diodes with heavily-doped n-type r-GeO2 epilayers grown on (001) TiO2 substrate
〇Kazutaka Kanegae1, Kazuki Shimazoe2, Ichiro Seike1, Hiroyuki Nishinaka1 (1.Kyoto Inst. of Tech., 2.Nagoya Inst. of Tech.)
[9p-B11-11]Electron traps in as-grown n-type r-GeO2 epilayers
〇Kazutaka Kanegae1, Kazuki Shimazoe2, Ichiro Seike1, Naoki Kita1, Hiroyuki Nishinaka1 (1.Kyoto Inst. of Tech., 2.Nagoya Inst. of Tech.)
