Presentation Information
[7P-M-334]Development of the high-throughput scan electron microscope for array tomography
*Tomohiro Haruta1, Yuuki Yamaguchi1, Motohiro Nakamura1 (1. JEOL Ltd.,)
Keywords:
Volume electron microscopy,array tomography,serial section,microscopy development,organelle
Password required to view
Comment
To browse or post comments, you must log in.Log in