The 73rd JSAP Spring Meeting 2026
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Session Details

Oral presentation7 Beam Technology and Nanofabrication : 7.2 Applications and technologies of electron beams

[16a-S4_203-1~12]7.2 Applications and technologies of electron beams

Mon. Mar 16, 2026 9:00 AM - 12:15 PM JST
Mon. Mar 16, 2026 12:00 AM - 3:15 AM UTC
S4_203 (South Bldg. 4)
9:00 AM - 9:15 AM JST(12:00 AM - 12:15 AM UTC)

[16a-S4_203-1]Classification of SE and BE in SEM observation

〇Takashi Sekiguchi1, Yuanzhao Yao1 (1.Univ. Tsukuba)
9:15 AM - 9:30 AM JST(12:15 AM - 12:30 AM UTC)

[16a-S4_203-2]Observation of TGV hole cracks using low-vacuum SEM

〇Yuanzhao Yao1, Shuhei Shibuya1, Minjae Kim1, Wei Feng2, Yusuke Takei2, Takashi Sekiguchi1 (1.Tsukuba Univ., 2.AIST)
9:30 AM - 9:45 AM JST(12:30 AM - 12:45 AM UTC)

[16a-S4_203-3]Acquisition and Evaluation of Angle-resolved SEM Images Using a Dodecahedron SE/BSE Detector

〇Yuto Yanagihara1, Kazuhiro Kumagai2,3, Yuanzhao Yao2, Takashi Sekiguchi2 (1.GPI, 2.Univ. of Tsukuba, 3.AIST)
9:45 AM - 10:00 AM JST(12:45 AM - 1:00 AM UTC)

[16a-S4_203-4]Development of high-speed recordable direct electron detectors using SOI technology Ⅲ

〇Yuichi Ishida1, Takafumi Ishida1,2, Makoto Kuwahara1,2, Yasuo Arai3, Koh Saitoh1,2 (1.Grad. Sch. of Eng., Nagoya Univ., 2.IMaSS, 3.KEK)
10:00 AM - 10:15 AM JST(1:00 AM - 1:15 AM UTC)

[16a-S4_203-5]Development of an electron gun using a transmission type LaB6 thin film photocathode Ⅱ

〇(M1)Sota Doke1, Takafumi Ishida1,2, Koh Saitoh1,2 (1.Grad. Sch. of Eng., Nagoya Univ., 2.IMaSS, Nagoya Univ.)
10:15 AM - 10:30 AM JST(1:15 AM - 1:30 AM UTC)

[16a-S4_203-6]STEM observation and EDS analysis of CeB6 thermionic cathode used in the SACLA XFEL

〇Satoshi Yamamoto1, Takafumi Ishida1,2, Makoto Kuwahara1,2, Koh Saitoh1,2, Kazuaki Togawa3 (1.Grad. Sch. of Eng., Nagoya Univ., 2.IMaSS ,Nagoya Univ., 3.RIKEN)
10:45 AM - 11:00 AM JST(1:45 AM - 2:00 AM UTC)

[16a-S4_203-7]Development of Atomic Resolution Transmission Electron Microscope with Information Science and its Application to High-speed Video Imaging

〇Tsukasa Hirayama1, Yuki Nomura1, Satoshi Anada1, Hirokazu Sasaki2, Kazuo Yamamoto1 (1.Japan Fine Ceramics Center, 2.Furukawa Electric Co., Ltd.)
11:00 AM - 11:15 AM JST(2:00 AM - 2:15 AM UTC)

[16a-S4_203-8]Asymmetric Electron Beam Profile Estimation in Scanning Electron Microscopy

〇Yasunari Sohda1, Michiru Tanaka1 (1.Univ. of Tsukuba)
11:15 AM - 11:30 AM JST(2:15 AM - 2:30 AM UTC)

[16a-S4_203-9]Chromaticity and Aberrations of Optical-Field Electron Lenses

〇Yuuki Uesugi1, Yuichi Kozawa1 (1.Tohoku Univ.)
11:30 AM - 11:45 AM JST(2:30 AM - 2:45 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[16a-S4_203-10]Unique contrast of final state selective mapping in the edge of monolayer graphene using electron energy-loss spectroscopy

〇Chisaki Iwashimizu1, Masanori Koshino2, Kazu Suenaga1 (1.SANKEN, Osaka Univ., 2.AIST)
11:45 AM - 12:00 PM JST(2:45 AM - 3:00 AM UTC)

[16a-S4_203-11]Development of an EELS Spectral Separation Method for Estimating Li Compound Ratios

〇Shunji Oishi1 (1.Sumitomo Metal Mining Co., Ltd.)
12:00 PM - 12:15 PM JST(3:00 AM - 3:15 AM UTC)

[16a-S4_203-12]Electrochemical Liquid Cell STEM Observation of Alkaline Water Electrolysis OER Catalysts

〇Masaki Takeguchi1, Reona Suzuki2, Keisuke Obata2, Kazuhiro Takanabe2 (1.NIMS, 2.UTokyo)
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