Session Details

[10p-N324-1~12]8.2 Plasma deposition of thin film, plasma etching and surface treatment

Wed. Sep 10, 2025 1:30 PM - 4:45 PM JST
Wed. Sep 10, 2025 4:30 AM - 7:45 AM UTC
N324 (Lecture Hall North)

[10p-N324-1]Anisotropic Cyclic Etching of Platinum Films using Oxygen Plasma and Formic Acid Vapor Treatment

〇Kazuhiro Miwa1, T. T. Nga Nguyen1, Daijiro Akagi2, Masaru Hori1, Kenji Ishikawa1 (1.Nagoya Univ., 2.AGC Inc.)

[10p-N324-2]Reactivity of Fluorinated GaN Surface in Electron-Beam-Assisted Atomic Layer Etching

〇(M1)Daito Shimazu1, Shunya Hirai1, Takayoshi Tsutsumi2, Makoto Sekine2, Kenichi Inoue2, Kenji Ishikawa2 (1.Nagoya Univ. Eng, 2.Nagoya Univ. cLPS)

[10p-N324-3]Etching characteristics of GaN in CH4 plasma

〇(M1)Shuto kudo1, Kazuo takahasi1 (1.Kyoto Inst.)

[10p-N324-4]Precise Control of Diamond Trench Profile Using Plasma Etching

〇Takuto Oya1, Trung Nguyen Tran2, Thi-Thuy-Nga Nguyen2, Kenichi Inoue2, Takayoshi Tsutsumi2, Kenji Ishikawa2 (1.Nagoya Univ., 2.Nagoya Univ. cLPS)

[10p-N324-5]Improvement of Etching Rate for Two-step Process of TiN

〇Yudai Mashiko1, Taku Iwase1, Makoto Satake1, Yasushi Sonoda2, Motohiro Tanaka2, Naoyuki Kofuji2, Kenji Maeda2 (1.Hitachi Ltd., R&D Group, 2.Hitachi High-Tech Corp.)

[10p-N324-6]Evaluation of W etching by energetic iodine ion

〇Takuma Yanagisawa1, Hojun Kang1, Song-Yun Kang2, Dongkyu Lee2, Yuna Lee2, Kazuhiro Karahashi1, Satoshi Hamaguchi1 (1.Osaka Univ., 2.Samsung Electronics)

[10p-N324-7]Effect of Gas-Phase Radical Composition Ratio on CFx Sticking Probability

〇(M2)Takumi Kurushima1, Takayoshi Tsutsumi2, Makoto Sekine2, Kenichi Inoue2, Kenji Ishikawa2 (1.Nagoya Univ. Eng., 2.Nagoya Univ. cLPS)

[10p-N324-8]Protection layer for plasma-CVD SiO2 film against low-temperature HF gas etching.

〇TSUBASA IMAMURA1, Masaki Yamada1 (1.Hitachi R&D)

[10p-N324-9]Investigation of the Influence of Depth Dependence of Radical Species in Sidewall Protection during Si Etching

〇Shuto Tsuchioka1, Kenichi Inoue2, Takayoshi Tsutsumi2, Makoto Sekine2, Kenji Ishikawa2 (1.Nagoya Uni., 2.cLPS)

[10p-N324-10]Elucidation of primary dissociation mechanisms of hydrofluorocarbons based on photoelectron-photoion coincidence (PEPICO) measurements

Trung Nguyen Tran1, Hiroshi Iwayama2, Toshio Hayashi1, Kenichi Inoue1, Takayoshi Tsutsumi1, 〇Kenji Ishikawa1 (1.Nagoya Univ., 2.IMS)

[10p-N324-11]Electronic properties and dissociation channels of CF3OCF3 molecule

〇Toshio Hayashi1, Kenji Ishikawa1, Makoto Sekine1, Masaru Hori1 (1.Nagoya Univ.)

[10p-N324-12]Electronic properties and dissociation channels of CF3OC2F5 molecule

〇Toshio Hayashi1, Kenji Ishikawa1, Makoto Sekine1, Masaru Hori1 (1.Nagoya Univ.)