Session Details

[8p-B11-1~16]8.2 Plasma deposition of thin film, plasma etching and surface treatment

Tue. Sep 8, 2026 2:00 PM - 6:30 PM JST
Tue. Sep 8, 2026 5:00 AM - 9:30 AM UTC
B11 (Faculty of Engineering B Block)

[8p-B11-1]Plasma atomic layer oxidation of silicon ~Oxidation temperature and self-limitation~

〇Shota Nunomura1, Kunihiro Kamataki2, Masaharu Shiratani2 (1.AIST, 2.Kyushu Univ.)

[8p-B11-2]Plasma etching of SiO2 ~ion species, barrier layer, and damage mitigation~

〇Shota Nunomura1, Yusuke Imai2, Shih-Nan HSIAO2, Takayoshi Tsutsumi2, Masaru Hori2 (1.AIST, 2.Nagoya Univ.)

[8p-B11-3]Quantitative Evaluation Method of Plasma-induced Damage in PECVD SiO2 Films using Discharge Current Transient Spectroscopy (DCTS): ΔQdcts Method

〇Kei Seki1, Keiichiro Urabe1, Koji Eriguchi1 (1.Kyoto Univ.)

[8p-B11-4]Investigation of interfacial structural changes in high-k/metal gate stacks induced by nitrogen radical treatment after TiN deposition

〇Mizuki Yano1, Honoka Kido1, Hiroki Kondo1 (1.Kyushu Univ. ISEE)

[8p-B11-5]Changes in dielectric breakdown mode and processing time dependence of high-k gate insulating films due to nitrogen radical post-treatment

〇(M2)Honoka Kido1, Mizuki Yano1, Hiroki Kondo1 (1.Kyushu Univ. ISEE)

[8p-B11-6]Energy dependence of electron-beam-assisted GaN surface fluorination

〇(M2)Daito Shimazu1, Takayoshi Tsutsumi2, Makoto Sekine2, Kenichi Inoue2, Kenji Ishikawa2 (1.Nagoya Univ. Eng, 2.Nagoya Univ. cLPS)

[8p-B11-7]Oxygen radical reaction of SiGe for selective isotropic etching of Si/SiGe

〇(M1C)Yamato Iwata1, Takayoshi Tsutstumi2, Katsunori Makihara1, Yuji Yamamoto3, Kenji Ishikawa2 (1.Nagoya Univ. Eng, 2.Nagoya Univ. cLPS, 3.IHP)

[8p-B11-8]Effects of O2 Addition on Highly Selective SiOCN Etching Using NF3-based Plasma

〇Takahiro Goya1, Masanaga Fukasawa1, Yoshihiro Hayashi1 (1.SFRC AIST)

[8p-B11-9]Analysis of Dry Etching Characteristics of Polyimide for Redistibution Layer

〇Ryoga Hosoda1, Yoichiro Kurita2, Kenichi Inoue1, Takayoshi Tsutsumi1, Kenji Ishikawa1 (1.Nagoya Univ., 2.Science Tokyo)

[8p-B11-10]Analysis of Wiggling Mechanisms in Fine ACL Patterns

〇Taiga Kasai1, Miyako Matsui2, Makoto Miura1, Kenichi Kuwahara1 (1.Hitachi High-Tech Corp., 2.Hitachi Ltd., R&D Group)

[8p-B11-11]Electronic properties and dissociation channels of CHF2CHFCHF2 molecule

〇Toshio Hayashi1, Kenji Ishikawa1, Makoto Sekine1, Masaru Hori1 (1.Nagoya Univ.)

[8p-B11-12]Electronic properties and dissociation channels of CHF2CF2CH2F molecule

〇Toshio Hayashi1, Kenji Ishikawa1, Makoto Sekine1, Masaru Hori1 (1.Nagoya Univ.)

[8p-B11-13]valuation of a Machine Learning Model for Predicting SiO2 Film Etching Rate
Based on Plasma and Material Information Science

〇(M2)Kazuki Nagamine1,2, S.W Fitriani2, Takayoshi Tsutsumi3, Masaharu Shiratani1, Kunihiro Kamataki1 (1.Kyushu Univ. ISEE, 2.Kyushu Univ. JGMI, 3.Nagoya Univ. cLPS)

[8p-B11-14]Efficient Optimization of Oxide Fill Process Conditions Using Topography Simulation and Robust Bayesian Optimization

〇Takuyo Nakayama1, Satoru Yokota1 (1.Kioxia Frontier Tech. R&D)

[8p-B11-15]Surrogate Learning and Optimization for Low-Pressure ICP Coil Design Based on Structural Feature

〇Daiki Kawahito1, Koki Hayashi1, Yukiya Saito1, Hironori Moki1 (1.Tokyo Electron Ltd.)

[8p-B11-16]Surrogate Model Development and Evaluation for Initial-Value Prediction in Plasma Simulations

〇Koki Hayashi1, Daiki Kawahito1, Yukiya Saito1, Hironori Moki1 (1.Tokyo Electron Ltd.)