Session Details

[8p-P10-1~49]21.1 Joint Session K "Wide bandgap oxide semiconductor materials and devices"

Mon. Sep 8, 2025 4:00 PM - 6:00 PM JST
Mon. Sep 8, 2025 7:00 AM - 9:00 AM UTC
P10 (Gymnasium)

[8p-P10-1]Temperature dependence on crystal growth of ZnO by mist CVD using tube furnace

〇Koki Kawabata1, Reira Hirota1, Tetsuya Kouno1 (1.Shizuoka Univ.)

[8p-P10-2]Citric acid addition to raw material solution on ZnO crystal growth by mist CVD

〇Reira Hirota1, Koki Kawabata1, Tetsuya Kouno1 (1.Shizuoka Univ.)

[8p-P10-3]Effect of deposition conditions on the crystal growth of NiO by Electrostatic Spray Deposition

〇Keisuke Shibata1, Kanata Tanaka1, Mutsumi Sugiyama1,2 (1.Tokyo Univ. Sci., 2.RIST)

[8p-P10-4]Effect of composition control on InGaZnO4 thin films by Electrostatic Spray Deposition

〇Hiroki Maruyama1, Kanata Tanaka1, Mutsumi Sugiyama1,2 (1.Tokyo Univ. Sci., 2.RIST)

[8p-P10-5]Development of a Mist CVD system for fabrication of uniform thin film at high temperatures under atmospheric pressure

〇Toshiyuki Kawaharamura1, Masahiko KOMATSU1, Tatsuya YASUOKA1, Htet Su WAI1, Abhay Kumar MONDAL1, Ryosuke OHASHI1, Tatsuki OKADA1, Yuya SATO2, Hiroshi OHKUBO2 (1.Kochi Univ. of Tech., 2.Toyo Tanso Co., Ltd.)

[8p-P10-6]Mist CVD Growth of κ-(InxGa1-x)2O3 on (111) 3C-SiC/Si templates

〇(M1)Misaki Nishikawa1, Shunsuke Enoki1, Yuma Tanaka1, Masatoshi Koyama1, Akihiko Fujii1, Toshihiko Maemoto1 (1.Osaka Inst. of Tech.)

[8p-P10-7]Effect of deionized water mist mixture on In2O3 deposition using Mist CVD

〇Haruki Ishikawa1, Tomohiro Yamaguchi1, Ryo Ishikawa1, Taro Izuka1, Sinya Aikawa1, Takeyoshi Onuma1, Tohru Honda1 (1.Kogakuin univ.)

[8p-P10-8]Solid phase epitaxy of Sb-doped rutile GeO2 thin films

〇(M1)Shohei Osawa1, Yo Nagashima2, Daichi Oka1, Yasushi Hirose1 (1.Tokyo Metropolitan Univ., 2.Univ. of Tokyo)

[8p-P10-9]Rock salt Ni1-xZnxO thin films grown by sol-gel method

〇Takashi Yasuda1, Ryuto Miyakoshi1, Shinji Nakagomi1 (1.ISU)

[8p-P10-10]Sputtering deposition of SnO thin films on Si substrate: Dependence on Si crystal orientation

〇(M1C)Yoshikazu Shin1, Aikawa Shinya1 (1.Kougakuin Univ.)

[8p-P10-11]Annealing treatment of a stacked film for the fabrication of p-type amorphous TaSnOx

〇(M1C)Yoshikazu Shin1, Takahashi Tsukasa1, Aikawa Shinya1 (1.Kougakuin Univ.)

[8p-P10-12]Basic research on the formation and annealing of gallium oxide on sapphire substrates

〇Fuminobu Imaizumi1, Takumi Morita1 (1.NIT, Oyama)

[8p-P10-13]Mist CVD Growth of Cu-doped a-In2O3 and Its Electrical characterization

〇(M1)Tarou Iizuka1, Ryo Ishikawa1, Haruki Ishikawa1, Hiroki Nagai1, Takeyoshi Onuma1, Tohru Honda1, Tomohiro Yamaguchi1 (1.Kogakuin university)

[8p-P10-14]Theoretical investigation for structural stability of Ga2O3 on α-Al2O3(0001) substrate

〇koki Ishida1, Akiyama Toru1, Kawamura Takahiro1 (1.Mie Univ.)

[8p-P10-15]Evaluation of Phase Transition and Crystal Orientation of Wurtzite Structure in Rocksalt-structured MgZnO Alloys

〇Kyosuke Tanaka1, Kotaro Ogwaa1, Tomohiro Yamaguchi1, Tohru Honda1, Takeyoshi Onuma1 (1.Kogakuin Univ.)

[8p-P10-16]SIMS Analysis of Homoepitaxial MgO Films Grown by Mist CVD Method

〇Kotaro Ogawa1, Kyosuke Tanaka1, Tomohiro Yamaguchi1, Tohru Honda1, Takeyoshi Onuma1 (1.Kogakuin Univ.)

[8p-P10-17]Investigation of buffer layers for the Growth of ε (κ)-Ga2O3 thin films by Mist CVD

〇Ryosuke Ohashi1, Tatsuki Okada1, Abhay Kumar Mondal1, Htet Su Wai1, Toshiyuki Kawaharamura1,2 (1.Sys. Eng, 2.Res. Inst)

[8p-P10-19]Growth of single-crystalline ZnO layer by UHV sputter epitaxy method (III)

〇Haruto Ikeda1, Kaito Horikoshi1, Keisuke Yoshida1, Hiroyuki Shinoda1, Nobuki Mutsukura1 (1.Tokyo Denki Univ.)

[8p-P10-20]Electrical properties of β-Ga2O3 homoepitaxial films grown by PLD

〇Kazuki koreishi1, Takuto Soma1, Kohei Yoshimatsu1, Akira Ohtomo1 (1.Science Tokyo, Dept. Chem. Sci. Eng.)

[8p-P10-21]Structural changes of ZnO films on amorphous quartz glass by anneal at high temperatures

〇Keigou Maejima1, Issa Kominato1 (1.Kagoshima Univ.)

[8p-P10-22]NiO Growth on Different-Oriented β-Ga2O3 and Glass Substrates

〇(M1)Sunao Tateishi1, Arihumi Okada1 (1.Kyoto Inst. Tech.)

[8p-P10-24]Change in conduction type of NiO films by thermal annealing

〇Harunobu Yasuda1, Takayuki Akiba1, Hironobu Miyamoto2, Kohei Sasaki2, Tomohiro Yamaguchi1, Tohru Honda1, Takeyoshi Onuma1 (1.Kogakuin Univ., 2.Novel Crystal)

[8p-P10-25]Deep-level traps in β-(AlxGa1-x)2O3 Schottky barrier diodes studied by deep level transient spectroscopy

〇(DC)Yun Jia1, Hironori Okumura1, Aboulaye Traore2, Yui Sasaki1, Kota Nakano1, Takeaki Sakurai1 (1.Univ. of Tsukuba, 2.Sorbonne Paris Nord Univ.)

[8p-P10-26]Effects of Hydroxyl Groups in Thermal Diffusion of Indium into ZnO Particles

〇(D)Abdul Md Halim1, Toshiyuki Yoshida1, Yasuhisa Fujita1 (1.Shimane University)

[8p-P10-27]Study on the Li+ ion diffusion mechanism in mist-CVD a-TiOx films

〇(M1)Fumiya Kobayashi1, Koumei Yamamoto5, Kaien Ka5, Hajime Shirai2,3, Hideki Kurihara4, Hirotaka Sone4, Tomomasa Sato2, Toshinori Ohno5 (1.Kanagawa Univ., 2.Kanagawa Univ. RIE., 3.Saitama Univ. RIE, 4.SAITEC, 5.AMAYA CO., LTD)

[8p-P10-28]Characterization of SnSO4 thin films (<10 nm) by an etch-back process

〇(M2)Kento Moriya1, Sokichi Naganawa1, Yukihiro Kudoh1, Taiju Takahashi1, Tomohiro Yamaguchi1, Shinya Aikawa1 (1.Kogakuin Univ.)

[8p-P10-29]Annealing Effect on Carrier Conduction of Nitrogen-Doped ZnO Nanoparticle layers

〇(D)Shrestha Dey Monty1, Yoshida Toshiyuki1, Fujita Yasuhisa1 (1.Shimane University)

[8p-P10-30]TEM observation of β-Ga2O3 grown by the OCCC method

〇Naoki Higuchi1, Kazuki Ohnishi1, Yongzhao Yao1, Taketoshi Tomida2, Koichi Kakimoto3, Masanori Kitahara2, Kei Kamada2,3, Kazuaki Akaiwa4, Akira Yoshikawa2,3 (1.Mie Univ., 2.C&A Corporation, 3.Tohoku Univ., 4.Tottri Univ.)

[8p-P10-31]Observation of OCCC β-Ga2O3 single crystal by synchrotron X-ray topography

〇Koki Mizuno1, Kazuki Ohnishi1, Yongzhao Yao1, Taketoshi Tomida2, Koichi Kakimoto3, Masanori Kitahara2, Kei Kamada2,3, Kazuaki Akaiwa4, Akira Yoshikawa2,3 (1.Mie Univ., 2.C&A Corporation, 3.Tohoku Univ., 4.Tottori Univ.)

[8p-P10-32]Measurement of Electric Properties of NiO/β-Ga2O3 Using Ga-In Electrodes

〇(M2)Yuto Nishi1, Okada Arifumi1 (1.Kyoto Inst. Tech)

[8p-P10-33]Thickness Dependence of Electronic States of Nanosheet Oxide Semiconductors at the Electrode-Oxide Interface

〇SUNBIN HWANG1, Kota Sakai3, Takanori Takahashi2, Mutsunori Uenuma1, Shinji Migita1, Yukiharu Uraoka2, Masaharu Kobayashi3 (1.AIST, 2.NAIST, 3.IIS The Univ. Tokyo)

[8p-P10-34]The Enhancements of p-Type Semiconductor trends of Nitrogen-Doping ZnO: Role of Nitrogen and Oxygen Annealing

〇(M2)Abrarul Haque1, Yumika Yamada1, Shuhei Funaki1, Yasuji Yamada1 (1.Shimane University)

[8p-P10-35]Effect of Na Ion Addition on Ozone Reactivity of Solution-processed IGZO-TFTs

〇Kansai Yamako1, Sasajima Hiroharu1, Morimoto Takaaki1, Keisuke Ishii1 (1.NDA)

[8p-P10-36]Fabrication and optical transmittance properties of UV-transparent conductive films based on In-Al-O

〇Masaki Yasuda1, Daichi Takeya1, Kotaro Murata1, Jumpei Kamikawa1, Hiroko Kominami1, Kazuhiko Hara1, Akihiro Yamaji2, Shunsuke Kurosawa2 (1.Shizuoka Univ., 2.Tohoku Univ.)

[8p-P10-37]Fabrication of low-resistivity ZnO:Al films on glass substrates using Solid-Phase-Crystallized ZnON seed layers: Effects of crystallization degree of as-deposited seed layers

〇Yoshiharu Wada1, Wenrui Xie1, Naoto Yamashita1, Takamasa Okumura1, Kunihiro Kamataki1, Kazunori Koga1, Masaharu Shiratani1 (1.Kyushu Univ.)

[8p-P10-38]EffectImprovement of annealingtransparent temperatureconductivity onof Zr-doped ZnO transparent conducting thin films

〇kosuke Matsumoto1, Ichiro Takano2 (1.Grad School, Kogakuin Univ., 2.Kogakuin Univ.)

[8p-P10-39]Vacuum Annealing Time Dependence of the Properties of Zn + N co-doped ZnO Films

〇Haruki Ohmori1, Abrarul Haque1, Yumika Yamada1,2, Shuhei Funaki1, Yasuji Yamada1 (1.Shimane Univ., 2.Kobelco Res. Inst. Inc.)

[8p-P10-40]Charging effect of ZnO and Ga2O3 particles on Ga thermal diffusion into ZnO particles

〇(M2)Yuusuke Kawai1, Toshiyuki Yoshida1, Yasuhisa Fujita1 (1.Shimane Univ Natural science)

[8p-P10-41]Fabrication and characterization of top-gate InGaO thin-film transistors using aqueous precursor solutions with an excimer light irradiation processing

〇Hideya Ochiai1, Kazuki Ueda1, Takuya Nomura1, Akira Fujimoto1, Hideo Wada1, Masatoshi Koyama1, Akihiko Fujii1, Akihiro Shimizu2, Noritaka Takezoe2, Hiroyasu Ito2, Toshihiko Maemoto1 (1.Osaka Inst. of Tech., 2.Ushio Inc.)

[8p-P10-42]Effect of Oxidation Annealing on Amorphous p-type TeOX Thin-Film Transistors

〇Kazuho Ishi1, Yoshikazu Shin1, Shinya Aikawa1 (1.Kogakuin Univ.)

[8p-P10-43]Effect of Electroforming on Switching Behavior in SiOx ReRAM with ITO Electrodes

〇(M1C)Yuito Makishima1, Kento Moriya1, Shinya Aikawa1 (1.Kogakuin Univ.)

[8p-P10-44]Effect of RF power and deposition pressure on crystallinity and leakage current properties of HfO2 thin films

〇Taiyo Shinoda1, Hidenori Kawamura1,2, Mutsumi Kimura1 (1.Ryukoku Univ., 2.IMPR Center)

[8p-P10-45]Dependence of Electrical Characteristics on the Thickness of the Resistive Switching Layer in Ga-Sn-O Memristors

〇Ryusei Hagihara1, Tokiyoshi Matsuda1,2, Hidenori Kawanishi2, Mutsumi Kimura2,3 (1.Kindai Univ., 2.IMPR Center, 3.Ryukoku Univ.)

[8p-P10-46]Characteristics comparison between Ti and ITO electrodes in n-type α-Ga2O3

〇Yugo Yamaguchi1, Kotono Yamada1, Soma Nishio1, Ryuma Iida1, Shinya Aikawa1, Takeyoshi Onuma1, Tohru Honda1, Tomohiro Yamaguchi1 (1.Kogakuin Univ.)

[8p-P10-47]Fabrication and characterization of deep ultraviolet photodetectors using amorphous GaOx thin-films deposited on quartz glass substrates

〇Shunsuke Enoki1, Iori Yamasaki1, Misaki Nishikawa1, Masatoshi Koyama1, Akihiko Fujii1, Toshihiko Maemoto1 (1.Osaka Inst. of Tech.)

[8p-P10-48]Effect of Applying Voltage to the Back of the Substrate on Current Flow in ZnGa2O4 Polycrystalline Thin Films

〇(M1)Yuya Oguma1, Reiya Kase1, Tomoki Iitsuka1, Yasuharu Ohgoe1, Kazunuki Yamamoto2, Satoshi Ishii1 (1.Tokyo Denki Univ., 2.Chiba Univ.)

[8p-P10-49]Impact of non-thermal post-processes on NiO-based transparent TFTs on flexible substrates

〇Yoshiki Matsubayashi1, Taisei Hattori1, Yuna Koide1, Mutsumi Sugiyama1,2 (1.Tokyo Univ. Sci., 2.RIST)